Further Improve Your Measurements with the New Reed Contact Generation!
It may seem inconspicuous, but the reed contact is a central element in every PAT-Core, as it transmits the signal from the reference electrode to the contact pin of the PAT-Cell and, via this, to the potentiostat. A stable mechanical contact is required to ensure reliable measurements over thousands of hours, if possible, without measurement artifacts. This must also be guaranteed despite any electrolyte that may creep in between the contact during the measurement.
In our continuous efforts to improve the reliability and robustness of our instruments, we have developed the second-generation reed contact. Its new geometry leads to a stronger spring force, which massively improves contact with the test cell and reduces artifacts in reference potentials to a minimum.
The new Reed Contact 2nd Gen. will replace the older version in all pre-assembled insulation sleeves from May 2025. The individual components for self-assembly will be available within the next few months.
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